What is JTAG
- Joint Test Action Group(international group of electronic manufactuers, including Texas instruments)
- IEEE standard 1149.1-1990
- The circuitary contains an interface through which instructions and test data are communicated
- The IEEE 1149.1-1990 standard requires a test interface known as the Test Access Port(TAP)
TAP's 4 required signals
- Test Mode Select(TMS)
- Test Clock(TCK)
- Test Data In(TDI)
- Test Data Out(TDO)
- Test Reset : Optional
TAP controller
- The TAP controller is a 16-state, finite-state machine programmed by TMS and TCK inputs
- The Capture state loads data or instruction bits in parallel into the data or instruction registers
- The Shift state moves the captured data or instruction out through TDO and simutaneously allows new data or instructions to be shifted in through TDI
- The Update state causes the newly shifted data to be latched onto the parallel outputs of the selected register
JTAG's 4 data registers
- Boundary-scan (required)
- Bypass (required)
- Deivice ID (optional)
- User-defined (optional)